Dynamical Analysis of Sputtering at Threshold Energy Range: Modelling of Ar+Ni(100) Collision System
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Abstract
The sputtering process of Ar+Ni(100) collision systems is investigated by means of constant energy molecular dynamics simulations. The Ni(100) slab is mimicked by an embedded-atom potential, and the interaction between the projectile and the surface is modelled by using the reparametrized ZBL
potential. Ni atom emission from the lattice is analysed over the range of 20--50eV collision energy. Sputtering yield, angular and energy distributions of the scattered Ar and of the sputtered Ni atoms are calculated, and compared to the available theoretical andexperimental data.
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HUNDUR Yakup, GUVENC Ziya B, HIPPLER Rainer. Dynamical Analysis of Sputtering at Threshold Energy Range: Modelling of Ar+Ni(100) Collision System[J]. Chin. Phys. Lett., 2008, 25(2): 730-733.
HUNDUR Yakup, GUVENC Ziya B, HIPPLER Rainer. Dynamical Analysis of Sputtering at Threshold Energy Range: Modelling of Ar+Ni(100) Collision System[J]. Chin. Phys. Lett., 2008, 25(2): 730-733.
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HUNDUR Yakup, GUVENC Ziya B, HIPPLER Rainer. Dynamical Analysis of Sputtering at Threshold Energy Range: Modelling of Ar+Ni(100) Collision System[J]. Chin. Phys. Lett., 2008, 25(2): 730-733.
HUNDUR Yakup, GUVENC Ziya B, HIPPLER Rainer. Dynamical Analysis of Sputtering at Threshold Energy Range: Modelling of Ar+Ni(100) Collision System[J]. Chin. Phys. Lett., 2008, 25(2): 730-733.
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