THE STRUCTURAL CHANGE OF Mo/GaAs INTERFACE AFTER ANNEALING

    Abstract
  • The interface contact of Mo/GaAs has been investigated by THREM and electron diffraction. It was found that a Mo3Ga structure was produced at the interfacial region after 500°C annealing due to the solid reaction.
    • FullText(HTML)
  • loading
    • References (0)
    • Related Articles
  • Supplements (0)

Catalog

    /

    DownLoad:  Full-Size Img  PowerPoint
    Return
    Return