Transmission Electron Microscopy Investigations of Misfit Dislocation Interactions in GaAs/lnGaAs Superlattices on GaAs (001) Substrates
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Abstract
The complex configurations and interactions of misfit dislocations in strained GaAs/InGaAs superlattices on GaAs (001) substrates have been studied by transmission electron microscopy under the two-beam or weak beam conditions. The observed interactions between a pair of 60°misfit dislocations and an orthogonal 60°misfit dislocation are theoretically explained.
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ZOU Jin, JIANG Shusheng, D. J. H. Cockayne, ZHANG Yunwu, GUO Xiang, PENG Zhengfu. Transmission Electron Microscopy Investigations of Misfit Dislocation Interactions in GaAs/lnGaAs Superlattices on GaAs (001) Substrates[J]. Chin. Phys. Lett., 1992, 9(7): 367-370.
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ZOU Jin, JIANG Shusheng, D. J. H. Cockayne, ZHANG Yunwu, GUO Xiang, PENG Zhengfu. Transmission Electron Microscopy Investigations of Misfit Dislocation Interactions in GaAs/lnGaAs Superlattices on GaAs (001) Substrates[J]. Chin. Phys. Lett., 1992, 9(7): 367-370.
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ZOU Jin, JIANG Shusheng, D. J. H. Cockayne, ZHANG Yunwu, GUO Xiang, PENG Zhengfu. Transmission Electron Microscopy Investigations of Misfit Dislocation Interactions in GaAs/lnGaAs Superlattices on GaAs (001) Substrates[J]. Chin. Phys. Lett., 1992, 9(7): 367-370.
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ZOU Jin, JIANG Shusheng, D. J. H. Cockayne, ZHANG Yunwu, GUO Xiang, PENG Zhengfu. Transmission Electron Microscopy Investigations of Misfit Dislocation Interactions in GaAs/lnGaAs Superlattices on GaAs (001) Substrates[J]. Chin. Phys. Lett., 1992, 9(7): 367-370.
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