Determination of Thermal Diffusivity of a Manganite Thin Film
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Abstract
Thermal diffusivity has been investigated in a manganite thin film La0.6Sr0.4MnO3 by means of transient grating (TG) technique at room temperature. A new method, which is generalized to two-layered samples of the thin film deposited on a semi-infinite substrate, is established to fit the TG signals. The thermal diffusivity of the La0.6Sr0.4MnO3 thin film with a thickness of 200nm on an MgO (100) substrate is determined to be 0.92mm2/s, which is slightly smaller than that of the single crystal sample (1mm2/s).
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