Effective Visible Emission from Porous Silicon
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Abstract
Concentration of Si-H2 bond in porous silicon layer (PSL) affects its photolu-minescence (PL) intensity and peak wavelength PL emission characters of PSL associate with not only its micro-structure, but also the Si-H2 band. So a stabilization of the emission intensity and the peak wavelength can be achieved by proper photochemical processing. A stable effective PL emission at wavelength as short as 570nm can be observed on PSL made by anodization method.
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Cite this article:
WENG Yumin, FAN Zhineng, ZONG Xiangfu. Effective Visible Emission from Porous Silicon[J]. Chin. Phys. Lett., 1993, 10(1): 18-20.
WENG Yumin, FAN Zhineng, ZONG Xiangfu. Effective Visible Emission from Porous Silicon[J]. Chin. Phys. Lett., 1993, 10(1): 18-20.
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WENG Yumin, FAN Zhineng, ZONG Xiangfu. Effective Visible Emission from Porous Silicon[J]. Chin. Phys. Lett., 1993, 10(1): 18-20.
WENG Yumin, FAN Zhineng, ZONG Xiangfu. Effective Visible Emission from Porous Silicon[J]. Chin. Phys. Lett., 1993, 10(1): 18-20.
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