Positron Annihilation During Pre-crystallizat ion Process in an Amorphous Silver Ionic Conductor

The study of positron annihilation on amorphous 0.60AgI-O.25Ag₂O-0.15P₂O₅ has been carried out in the temperature range from 100 to 350K. The temperature dependence of average lifetime shows anomalous peaks at 208, 228, 325, 338 K indicating possible structure relaxation. Especially the last two peaks reflect the structural changes during pre-crystallization process of the amorphous ionic conductor. These results are consistent with that of ultrasonic attenuation and ionic conductivity experiments on the same samples.