State-Resolved Ar II Population Distributions under Femtosecond Strong-Field Excitation
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Abstract
We measure spontaneous emission from Ar II ions produced by femtosecond strong-field excitation of argon and reconstruct state-resolved excited-state populations from selected emission lines spanning upper-level energies of ∼19-23 eV above the Ar II ground state. The ionic-line intensities follow a power-law dependence on pulse energy and a non-monotonic dependence on gas pressure, and the extracted populations deviate significantly from a Boltzmann distribution. The deviation grows with increasing pulse energy, reflecting a stronger nonequilibrium character of the initial population prepared by the strong field, and weakens with increasing gas pressure, consistent with collisional redistribution driving the system toward thermal equilibrium. These results establish ionic fluorescence as a practical state-resolved probe of nonequilibrium population distributions in strong-field-ionized argon.
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Cite this article:
Di Wang, Yuxuan Zhang, Zhigang Zheng, Mingyue Wang, Zhihui Lv, Li Wang, Xiaowei Wang, Dongwen Zhang, Jing Zhao, Zengxiu Zhao. State-Resolved Ar II Population Distributions under Femtosecond Strong-Field ExcitationJ.
Chin. Phys. Lett..
DOI: 10.1088/0256-307X/43/6/060301
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Di Wang, Yuxuan Zhang, Zhigang Zheng, Mingyue Wang, Zhihui Lv, Li Wang, Xiaowei Wang, Dongwen Zhang, Jing Zhao, Zengxiu Zhao. State-Resolved Ar II Population Distributions under Femtosecond Strong-Field ExcitationJ. Chin. Phys. Lett.. DOI: 10.1088/0256-307X/43/6/060301
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Di Wang, Yuxuan Zhang, Zhigang Zheng, Mingyue Wang, Zhihui Lv, Li Wang, Xiaowei Wang, Dongwen Zhang, Jing Zhao, Zengxiu Zhao. State-Resolved Ar II Population Distributions under Femtosecond Strong-Field ExcitationJ. Chin. Phys. Lett.. DOI: 10.1088/0256-307X/43/6/060301
|
Di Wang, Yuxuan Zhang, Zhigang Zheng, Mingyue Wang, Zhihui Lv, Li Wang, Xiaowei Wang, Dongwen Zhang, Jing Zhao, Zengxiu Zhao. State-Resolved Ar II Population Distributions under Femtosecond Strong-Field ExcitationJ. Chin. Phys. Lett.. DOI: 10.1088/0256-307X/43/6/060301
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