Dressed Four-Wave Mixing Spectroscopy Modified by Polarization Interference and Atom-Wall Collision in Micrometric Thin Cells
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Abstract
Dressed four-wave mixing (DFWM) spectroscopy is investigated theoretically in some micrometric thin cells. It is found that DFWM spectra can be modified by polarization interference of atoms and transient effects induced by atom-wall collision. This modification can lead to width-narrowing of DFWM lines and facilitates to implement experiment of high resolution DFWM spectroscopy in a confined atomic system.
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LI Yuan-Yuan, LI-Li, BAI Jin-Tao, LI Chang-Biao, ZHANG Yan-Peng, HOU Xun. Dressed Four-Wave Mixing Spectroscopy Modified by Polarization Interference and Atom-Wall Collision in Micrometric Thin Cells[J]. Chin. Phys. Lett., 2010, 27(4): 044203. DOI: 10.1088/0256-307X/27/4/044203
LI Yuan-Yuan, LI-Li, BAI Jin-Tao, LI Chang-Biao, ZHANG Yan-Peng, HOU Xun. Dressed Four-Wave Mixing Spectroscopy Modified by Polarization Interference and Atom-Wall Collision in Micrometric Thin Cells[J]. Chin. Phys. Lett., 2010, 27(4): 044203. DOI: 10.1088/0256-307X/27/4/044203
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LI Yuan-Yuan, LI-Li, BAI Jin-Tao, LI Chang-Biao, ZHANG Yan-Peng, HOU Xun. Dressed Four-Wave Mixing Spectroscopy Modified by Polarization Interference and Atom-Wall Collision in Micrometric Thin Cells[J]. Chin. Phys. Lett., 2010, 27(4): 044203. DOI: 10.1088/0256-307X/27/4/044203
LI Yuan-Yuan, LI-Li, BAI Jin-Tao, LI Chang-Biao, ZHANG Yan-Peng, HOU Xun. Dressed Four-Wave Mixing Spectroscopy Modified by Polarization Interference and Atom-Wall Collision in Micrometric Thin Cells[J]. Chin. Phys. Lett., 2010, 27(4): 044203. DOI: 10.1088/0256-307X/27/4/044203
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