[1] | Dembele V, Jin M, Baek B J and Kim D 2016 Opt. Express 24 14419 | Dynamic spectro-polarimeter based on a modified Michelson interferometric scheme
[2] | Jellison G E 1996 Thin Solid Films 290–291 40 | The calculation of thin film parameters from spectroscopic ellipsometry data
[3] | Watkins L R 2008 Appl. Opt. 47 2998 | Interferometric ellipsometer
[4] | Kim D, Seo Y, Jin M, Yoon Y, Chegal W, Cho Y J, Cho H M, Abdelsalam D G and Magnusson R 2014 Opt. Express 22 17430 | Stokes vector measurement based on snapshot polarization-sensitive spectral interferometry
[5] | Kim D, Seo Y, Yoon Y, Dembele V, Yoon J, Lee K and Magnusson R 2016 Opt. Lett. 41 2318 | Robust snapshot interferometric spectropolarimetry
[6] | Ibrahim D G A 2019 Curr. Appl. Phys. 19 822 | A series of microscope objective lenses combined with an interferometer for individual nanoparticles detection
[7] | Millerd J E, Brock N J, Hayes J B, North-Morris M B, Novak M and Wyant J C 2004 Proc. SPIE 5531 304 | SPIE Proceedings
[8] | Millerd J, Brock N, Hayes J, Kimbrough B, Novak M, North-Morris M and Wyant J C 2005 Proc. SPIE 5856 14 | SPIE Proceedings
[9] | Tyo J S, Goldstein D L, Chenault D B and Shaw J A 2006 Appl. Opt. 45 5453 | Review of passive imaging polarimetry for remote sensing applications
[10] | Abdelsalam D G and Kim D 2011 Appl. Opt. 50 6153 | Two-wavelength in-line phase-shifting interferometry based on polarizing separation for accurate surface profiling
[11] | Azzam R M A and Bashara N M 1976 Ellipsometry and Polarized Light (Amsterdam: North-Holland) |
[12] | Novak N, Millerd J, Brock N, North-Morris M, Hayes J and Wyant J 2005 Appl. Opt. 44 6861 | Analysis of a micropolarizer array-based simultaneous phase-shifting interferometer
[13] | Toto-Arellano N I 2017 J. Mod. Opt. 64 S20 | 4D measurements of biological and synthetic structures using a dynamic interferometer
[14] | Kimbrough B T 2006 Appl. Opt. 45 4554 | Pixelated mask spatial carrier phase shifting interferometry algorithms and associated errors
[15] | Abdelsalam D G, Yao B, Gao P, Min J and Guo R 2012 Appl. Opt. 51 4891 | Single-shot parallel four-step phase shifting using on-axis Fizeau interferometry
[16] | Brock N, Hayes J, Kimbrough B, Millerd J, North-Morris M, Novak M and Wyant J 2005 Proc. SPIE 5875 58750F | SPIE Proceedings
[17] | Chenault D B and Chipman R A 1993 Appl. Opt. 32 4223 | Infrared birefringence spectra for cadmium sulfide and cadmium selenide
[18] | Abdelsalam D G and Yasui T 2018 Appl. Phys. Lett. 112 171101 | Multi-object investigation using two-wavelength phase-shift interferometry guided by an optical frequency comb
[19] | Abdelsalam D G and Yasui T 2018 Opt. Lett. 43 1758 | High-precision 3D surface topography measurement using high-stable multi-wavelength digital holography referenced by an optical frequency comb
[20] | Abdelsalam D G and Kim D 2011 Opt. Express 19 17951 | Coherent noise suppression in digital holography based on flat fielding with apodized apertures
[21] | Abdelsalam D G, Shaalan M S and Eloker M M 2010 Opt. Lasers Eng. 48 543 | Surface microtopography measurement of a standard flat surface by multiple-beam interference fringes at reflection
[22] | Abdelsalam D G, Magnusson R and Kim D 2011 Appl. Opt. 50 3360 | Single-shot, dual-wavelength digital holography based on polarizing separation
[23] | Bioucas-Dias J M and Valadão G 2007 IEEE Trans. Image Process. 16 698 | Phase Unwrapping via Graph Cuts
[24] | Tian C and Liu S 2016 Opt. Express 24 18695 | Two-frame phase-shifting interferometry for testing optical surfaces