Electrically and Optically Bistable Operation in an Integration of a 1310nm DFB Laser and a Tunneling Diode
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Abstract
We experimentally demonstrate an InP-based hybrid integration of a single-mode DFB laser emitting at around 1310 nm and a tunneling diode. The evident negative differential resistance regions are obtained in both electrical and optical output characteristics. The electrical and optical bistabilities controlled by the voltage through the tunneling diode are also measured. When the voltage changes between 1.46 V and 1.66 V, a 200-mV-wide hysteresis loop and an optical power ON/OFF ratio of 17 dB are obtained. A side-mode suppression ratio of the integrated device in the ON state is up to 43 dB. The tunneling diode can switch on/off the laser within a very small voltage range compared with that directly controlled by a voltage source.
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Ya-Jie Li, Jia-Qi Wang, Lu Guo, Guang-Can Chen, Zhao-Song Li, Hong-Yan Yu, Xu-Liang Zhou, Huo-Lei Wang, Wei-Xi Chen, Jiao-Qing Pan. Electrically and Optically Bistable Operation in an Integration of a 1310nm DFB Laser and a Tunneling Diode[J]. Chin. Phys. Lett., 2018, 35(4): 044202. DOI: 10.1088/0256-307X/35/4/044202
Ya-Jie Li, Jia-Qi Wang, Lu Guo, Guang-Can Chen, Zhao-Song Li, Hong-Yan Yu, Xu-Liang Zhou, Huo-Lei Wang, Wei-Xi Chen, Jiao-Qing Pan. Electrically and Optically Bistable Operation in an Integration of a 1310nm DFB Laser and a Tunneling Diode[J]. Chin. Phys. Lett., 2018, 35(4): 044202. DOI: 10.1088/0256-307X/35/4/044202
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Ya-Jie Li, Jia-Qi Wang, Lu Guo, Guang-Can Chen, Zhao-Song Li, Hong-Yan Yu, Xu-Liang Zhou, Huo-Lei Wang, Wei-Xi Chen, Jiao-Qing Pan. Electrically and Optically Bistable Operation in an Integration of a 1310nm DFB Laser and a Tunneling Diode[J]. Chin. Phys. Lett., 2018, 35(4): 044202. DOI: 10.1088/0256-307X/35/4/044202
Ya-Jie Li, Jia-Qi Wang, Lu Guo, Guang-Can Chen, Zhao-Song Li, Hong-Yan Yu, Xu-Liang Zhou, Huo-Lei Wang, Wei-Xi Chen, Jiao-Qing Pan. Electrically and Optically Bistable Operation in an Integration of a 1310nm DFB Laser and a Tunneling Diode[J]. Chin. Phys. Lett., 2018, 35(4): 044202. DOI: 10.1088/0256-307X/35/4/044202
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