CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Remanence Enhancement Effect in Ni$_{0.7}$Zn$_{0.3}$Fe$_{2}$O$_{4}$/Co$_{0.8}$Fe$_{2.2}$O$_{4}$ Ferrite Multilayer Film |
Cheng-Hua Fan1,2, Qun-Jing Wang1, Zhen-Fa Zi2** |
1School of Electrical Engineering and Automation, Anhui University, Hefei 230601 2School of Electrical and Information Engineering, Hefei Normal University, Hefei 230601
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Cite this article: |
Cheng-Hua Fan, Qun-Jing Wang, Zhen-Fa Zi 2016 Chin. Phys. Lett. 33 117304 |
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Abstract Ni$_{0.7}$Zn$_{0.3}$Fe$_{2}$O$_{4}$/Co$_{0.8}$Fe$_{2.2}$O$_{4}$ (NZFO/CFO) multilayer films are fabricated on Si(100) substrates by the chemical solution deposition method. The microstructure and magnetic properties are systematically investigated. The results of field-emission scanning electronic microscopy show that the grain size of the NZFO/CFO multilayer film is quite uniform and the thickness is about 300 nm. The remanence enhancement effect of the NZFO/CFO multilayer film can be mainly attributed to the exchange coupling interaction between NZFO and CFO ferrite films, which is in favor of the design and fabrication of modern electronic devices.
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Received: 24 May 2016
Published: 28 November 2016
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PACS: |
73.61.-r
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(Electrical properties of specific thin films)
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73.90.+f
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(Other topics in electronic structure and electrical properties of surfaces, interfaces, thin films, and low-dimensional structures)
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Fund: Supported by the National Natural Science Foundation of China under Grant Nos 11274314, 11374304, 51102072, 21201052 and U1632161, the Natural Science Major Foundation of Anhui Provincial Higher Education Institutions under Grant No KJ2012ZD14, the Natural Science Foundation of Anhui Province under Grant No 1508085MA18, the Postdoctoral Science Foundation of China under Grant No 2013M541848, and the Foundation for University Key Teachers from Hefei Normal University under Grant No 2014136JKC08. |
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