| CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES |
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Effect of the O2/Ar Pressure Ratio on the Microstructure and Surface Morphology of Epi-MgO/IBAD-MgO Templates for GdBa2Cu3O7?δ Coated Conductors |
| LUO Qiang, LIU Lin-Fei, XIAO Gui-Na, LI Yi-Jie** |
Department of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240
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| Cite this article: |
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LUO Qiang, LIU Lin-Fei, XIAO Gui-Na et al 2014 Chin. Phys. Lett. 31 037402 |
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Abstract High-quality epi-MgO buffer layers under different O2/Ar pressure ratios are fabricated by rf magnetron sputtering on textured IBAD-MgO templates. Under the total deposition pressure remaining constant (14 Pa), the effect of changing the ratio of O2/Ar pressure from 1:4 to 3:2 on the microstructure and surface morphology of epi-MgO films is studied. The microstructure and morphology of epi-MgO are fully characterized by x-ray diffraction, atom force microscope and scanning electron microscope. The best texture quality of epi-MgO with an out-plane Δω value of 1.8° and an in-plane Δ? value of 5.22° are obtained under the ratio of O2/Ar pressure 3:2. Further, the surface morphology indicates that the surface of epi-MgO is smooth with rms surface roughness about 4.7 nm at O2/Ar pressure ratio 3:2. After that, GdBa2Cu3O7?δ (GBCO) layers are deposited on the CeO2 cap layer buffered epi-MgO/IBAD-MgO templates to assess the efficiency of such a buffer layer stack. The critical current density of GBCO films (thickness of 200 nm) is higher than 3 MA/cm2, indicating that epi-MgO/IBAD-MgO is promising for depositing superconducting layers with a higher critical current density.
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Received: 11 December 2013
Published: 28 February 2014
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| PACS: |
74.25.-q
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(Properties of superconductors)
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74.25.Sv
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(Critical currents)
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68.37.Hk
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(Scanning electron microscopy (SEM) (including EBIC))
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81.15.Fg
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(Pulsed laser ablation deposition)
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74.62.Dh
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(Effects of crystal defects, doping and substitution)
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