Chin. Phys. Lett.  2013, Vol. 30 Issue (6): 060701    DOI: 10.1088/0256-307X/30/6/060701
GENERAL |
The Effect of By-pass Current on the Accuracy of Resistivity Measurement in a Diamond Anvil Cell
YANG Jie1,2, PENG Gang2, LIU Cai-Long2, LU Han2, HAN Yong-Hao2**, GAO Chun-Xiao2**
1Department of Fundamental, Aviation University of Airforce, Changchun 130012
2State Key Laboratory of Superhard Materials, Jilin University, Changchun 130012
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YANG Jie, PENG Gang, LIU Cai-Long et al  2013 Chin. Phys. Lett. 30 060701
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Abstract We report a quantitative analysis of by-pass current effect on the accuracy of resistivity measurement in a diamond anvil cell. Due to the by-pass current, the sample resistivity calculated by the van der Pauw method is obviously smaller than the actual value and the problem becomes more serious for a high-resistivity sample. For the consideration of high accuracy of resistivity measurement, a method is presented that the inside wall of the sample chamber should be covered by a polymethylmethane layer. With this highly insulating layer, the by-pass current is effectively prevented and the current density distribution inside the sample is very close to the ideal case.
Received: 15 February 2013      Published: 31 May 2013
PACS:  07.35.+k (High-pressure apparatus; shock tubes; diamond anvil cells)  
  61.72.uj (III-V and II-VI semiconductors)  
  62.50.-p (High-pressure effects in solids and liquids)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/30/6/060701       OR      https://cpl.iphy.ac.cn/Y2013/V30/I6/060701
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YANG Jie
PENG Gang
LIU Cai-Long
LU Han
HAN Yong-Hao
GAO Chun-Xiao
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