CROSS-DISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY |
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A 50–60 V Class Ultralow Specific on-Resistance Trench Power MOSFET |
HU Sheng-Dong1,2**, ZHANG Ling1, CHEN Wen-Suo2, LUO Jun2, TAN Kai-Zhou2, GAN Ping1, ZHU Zhi1, WU Xing-He1 |
1College of Communication Engineering, Chongqing University, Chongqing 400044 2No. 24 Research Institute, China Electronics Technology Group Corporation, Chongqing 400060
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Cite this article: |
HU Sheng-Dong, ZHANG Ling, CHEN Wen-Suo et al 2012 Chin. Phys. Lett. 29 128502 |
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Abstract A 50–60 V class ultralow specific on-resistance (Ron,sp) trench power MOSFET is proposed. The structure is characterized by an n+-layer which is buried on the top surface of the p-substrate and connected to the drain n+-region. The low-resistance n+-layer shortens the motion-path in high-resistance n? drift region for the carriers, and therefore, reduces the Ron,sp in the on-state. Electrical characteristics for the proposed power MOSFET are analyzed and discussed. The 50–60 V class breakdown voltages (VB) with Ron,sp less than 0.35 mΩ?cm2 are obtained. Compared with several power MOSFETs, the proposed power MOSFET has a significantly optimized dependence of Ron,sp on VB.
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Received: 22 August 2012
Published: 04 March 2013
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PACS: |
85.30.De
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(Semiconductor-device characterization, design, and modeling)
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85.30.-z
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(Semiconductor devices)
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85.30.Mn
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(Junction breakdown and tunneling devices (including resonance tunneling devices))
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[1] Zitouni M, Morancho F, Tranduc H et al 1998 International Semiconductor Conference 1 137 [2] Zitouni M, Morancho F, Rossel P et al 1999 Proc. ISPSD p 73 [3] Disney D, Chan W, Lam R et al 2008 Proc. ISPSD p 24 [4] Fujishima N and Salama C A T 1997 Proc. IEDM p 359 [5] Varadarajan K R, Chow T P, Wang J et al 2007 Proc. ISPSD p 233 [6] Varadarajan K R, Sinkar A and Chow T P 2006 IEEE Workshop Comput. Power Electron. p 306 [7] Varadarajan K R, Sinkar A and Chow T P 2007 IEEE Power Electron. Special. ists Conf. p 1013 [8] Varadarajan K R, Chow T P, Liu R et al 2008 Proc. ISPSD p 119 [9] Luo X R, Yao G L, Chen X et al 2011 Chin. Phys. B 20 028501-1 [10] Hu S D, Luo X R, Li Z J et al 2010 Electron. Lett. 46 82 [11] Hu S D, Zhang B and Li Z J 2011 Int. J. Electron. 98 973 [12] Hu S D, Zhang L, Luo X R et al 2011 Chin. Phys. Lett. 28 128503 [13] Hu S D, Luo J, Tan K Z et al 2012 Microelectronics Reliability 52 692 [14] TMA MEDICI 4.2 (Palo Alto CA: Technology Modeling Associates Inc.) [15] Tatsuhiko F and Yasushi M 1998 Proc. ISPSD p 423 [16] Sameer P, Robert P, Takehito T et al 2004 Proc. ISPSD p 419 |
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Abstract
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