Chin. Phys. Lett.  2012, Vol. 29 Issue (3): 030702    DOI: 10.1088/0256-307X/29/3/030702
GENERAL |
A Single-Transistor Active Pixel CMOS Image Sensor Architecture
ZHANG Guo-An1, ZHANG Dong-Wei2, HE Jin1,2**, SU Yan-Mei2, WANG Cheng2, CHEN Qin2, LIANG Hai-Lang2, YE Yun2
1School of Electronics and Information, Nantong University, Nantong 226019
2Peking University Shenzhen SOC Key Laboratory, PKU-HKUST Shenzhen-Hongkong Institution, IER Bldg., Hi-Tech Industrial Park South, Shenzhen 518057
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ZHANG Guo-An, ZHANG Dong-Wei, YE Yun et al  2012 Chin. Phys. Lett. 29 030702
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Abstract A single-transistor CMOS active pixel image sensor (1 T CMOS APS) architecture is proposed. By switching the photosensing pinned diode, resetting and selecting can be achieved by diode pull-up and capacitive coupling pull-down of the source follower. Thus, the reset and selected transistors can be removed. In addition, the reset and selected signal lines can be shared to reduce the metal signal line, leading to a very high fill factor. The pixel design and operation principles are discussed in detail. The functionality of the proposed 1 T CMOS APS architecture has been experimentally verified using a fabricated chip in a standard 0.35 µm CMOS AMIS technology.
Keywords: 07.07.Df      61.72.Uj      85.60.-q     
Received: 03 November 2011      Published: 11 March 2012
PACS:  07.07.Df (Sensors (chemical, optical, electrical, movement, gas, etc.); remote sensing)  
  61.72.uj (III-V and II-VI semiconductors)  
  85.60.-q (Optoelectronic devices)  
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https://cpl.iphy.ac.cn/10.1088/0256-307X/29/3/030702       OR      https://cpl.iphy.ac.cn/Y2012/V29/I3/030702
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ZHANG Guo-An
ZHANG Dong-Wei
YE Yun
WANG Cheng
SU Yan-Mei
LIANG Hai-Lang
HE Jin
CHEN Qin
[1] Fossum F R 1995 IEEE International Electron Devices Meeting, Tech. Dig. (Pasadena, America December 1995) pp 17–25
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[3] Mori M, Katsuno M, Kasuga S, Murata T and Yamaguchi T 2004 IEEE International Solid-State Circuits Conference, Tech. Dig. 1 110
[4] H Takahashi, M Kinoshita, K Morita, T Shirai, T Sato, T Kimura, H Yuzurihara and S Inoue IEEE International Solid-State Circuits Conference, Tech. Dig. 1 108
[5] Zhang D W, He F, Bermak A and Chan M 2010 The 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) p 1468
[6] Cho K B, Krymski A and Fossum E R 2000 IEEE International Solid-State Circuits Conference, Tech. Dig. p 114
[7] J Bong, Y Kwon, D Kim and K Min IEICE Electron. Express 6 304
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