| FUNDAMENTAL AREAS OF PHENOMENOLOGY(INCLUDING APPLICATIONS) |
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Measurement of Random Surface Parameters by Angle-Resolved In-plane Light Scattering with Constant Perpendicular Wave Vector |
| LI Hai-Xia1,2, LIU Chun-Xiang1, CHEN Xiao-Yi1, ZHANG Mei-Na1, CHENG Chuan-Fu1**
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1College of Physics and Electronics, Shandong Normal University, Jinan 250014
2Department of Information Science and Technology, Shandong University of Politics Science and Law, Jinan 250014
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| Cite this article: |
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LI Hai-Xia, LIU Chun-Xiang, CHEN Xiao-Yi et al 2011 Chin. Phys. Lett. 28 024206 |
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Abstract We report the experimental method of angle-resolved in-plane light scattering for random surface parameter extraction. In the measurement of the scattered intensity profile at a certain angle of incidence, the perpendicular component of wave vector remains constant, which is realized by controlling the movement of the detector along a specified circular arc segment. We use the central δ−peak and the half-width of the diffused intensity profiles and their variations to obtain the roughness w, the lateral correlation length ξ and roughness exponent α of the rough surface sample. The measurement copes strictly with the theoretical analysis, and the inherent problem in previous in-plane light scattering experiment is overcome so that the changes of the perpendicular component of wave vector affect the half width a diffused intensity profile and the measurement accuracy.
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| Keywords:
42.25.Bs
78.20.Ek
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Received: 12 July 2010
Published: 30 January 2011
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| PACS: |
42.25.Bs
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(Wave propagation, transmission and absorption)
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78.20.Ek
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(Optical activity)
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[1] van Rossum M C W and Nieuwenhuizen T M 1999 Rev. Mod. Phys. 71 313
[2] Liou K N and Takano Y 1994 Atmospheric Res. 31 271
[3] Gu Z H and Maradudin A A 1997 Proc. SPIE 3141 220
[4] Choi W 2008 Opt. Lett. 33 1596
[5] Sayles R S and Thomas T R 1978 Nature 271 431
[6] Berry M V and Blackwell T M 1979 J. Phys. A 12 781
[7] Jakeman E 1986 Fractals in Physics ed Pietronero L and Tossati E (Amsterdam: Elsevier)
[8] LIN N et al 1995 J. Mod. Opt. 42 225
[9] Sinha S K, Sirota E B, Garoff S and Stanley H B 1988 Phys. Rev. B 38 2297
[10] Yang H N, Yang H N, Zhao Y P, Wang G C and Lu T M 1996 Phys. Rev. Lett. 76 3774
[11] Yang H N, Wang G C and Lu T M 1993 Diffraction from Rough Surfaces and Dynamic Growth Fronts (Singapore: World Scientific)
[12] Zhao Y P, Wu I, Cheng C F, Block U, Wang G C and Lu T M 1998 J. Appl. Phys. 84 2571
[13] Cheng C F et al 2002 Phys. Rev. E 65 061104
[14] Yang H N, Lu T M and Wang G C 1993 Phys. Rev. B 47 3911
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