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EFFECT OF GRAIN BOUNDARY NETWORK ON PATTERN FORMATION IN a-Ge/Au BILAYER FILMS |
HOU Jianguo1;WU Ziqin2;A. L. Vasilev;N. A. Kiselev |
1Fujian Institute of Research on the Structure of Matter, Academia Sinica, Fuzhou 350002
2Fundamental Physics Center, University of Science of Technology of China, Hefei 230026
Institute of Crystallography, USSR Academy of Sciences, Moscow, USSR |
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Cite this article: |
HOU Jianguo, WU Ziqin, A. L. Vasilev et al 1990 Chin. Phys. Lett. 7 357-360 |
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Abstract The a-Ge/p-Au bilayer thin films with different Au grain sizes were prepared. After annealing, different patterns of Ge appeared in the film morphology. It is found that the fractal dimensions of the patterns are highly dependent on the grain size of Au, and the experimental results indicate that the fractal formation in such system is truly dominated by the local latent temperature field.
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Keywords:
68.55.-a
05.70.Jk
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Published: 01 August 1990
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PACS: |
68.55.-a
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(Thin film structure and morphology)
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05.70.Jk
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(Critical point phenomena)
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