Chin. Phys. Lett.  1989, Vol. 6 Issue (10): 451-454    DOI:
Original Articles |
REGROWTH OF MBE-GaAs FILMS ON Si SUBSTRATES BY HIGH ENERGY ION-IMPLANTATION AND SUBSEQUENT ANNEALING
XIAO Guangming;YIN Shiduan;ZHANG Jingping;FAN Tiwen;LIU Jiarui*;DING Aiju*;ZHOU Junming*;ZHU Peiruan*
Institute of Semiconductors, Academia Sinica, Beijing *Institute of Physics, Academia Sinica, Beijing
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XIAO Guangming, YIN Shiduan, ZHANG Jingping et al  1989 Chin. Phys. Lett. 6 451-454
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Abstract 4.2MeV 7Li channeling technique, laser Raman scattering spectrometry, and TEM have been utilized to study the regrowth of MBE-GaAs films of ~μm thick on Si substrates by Si+ implantation (0.6-2.6Me V) and subsequent rapid thermal annealing. The results showed that crystalline disorder was greatly reduced in the recrystalized layers especially at the interface.

Keywords: 61.70.At      81.10.Jt     
Published: 01 October 1989
PACS:  61.70.At  
  81.10.Jt (Growth from solid phases (including multiphase diffusion and recrystallization))  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1989/V6/I10/0451
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XIAO Guangming
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LIU Jiarui
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ZHOU Junming
ZHU Peiruan
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