| Original Articles |
|
|
|
|
Remeasurement of the Half-Life of 79Se with the Projectile X-Ray Detection Method |
| JIANG Song-Sheng;HE Ming;DIAO Li-Jun;GUO Jing-Ru;WU Shao-Yong |
| China Institute of Atomic Energy, P. O. Box 275(49), Beijing
102413
|
|
| Cite this article: |
|
JIANG Song-Sheng, HE Ming, DIAO Li-Jun et al 2001 Chin. Phys. Lett. 18 746-749 |
|
|
|
Abstract Remeasurement of the half-life of 79Se has been carried out with the projectile x-ray detection (PXD) in accelerator mass spectrometry. We made two major improvements over our earlier 79Se half-life determination [Nucl. Instrum. Methods B 123 (1997) 403]. Fristly, the PXD technique has been used for separation of 79Se and 75Se from 79Br and 75As isobars respectively. Secondly, the half-life of 79Se has been measured relative to the known precise half-life of 75Se (119.79 ± 0.04d). A more reliable half-life of 79Se measured with the PXD technique is (2.95 ± 0.38)x105y, about a factor of one lower than the previous value, 1.1 x 106y. The problems in the previous measurement are discussed.
|
| Keywords:
21.10.Tg
27.50.+e
07.75.+h
29.30.Kv
|
|
|
Published: 01 June 2001
|
|
|
|
|
|
|
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
