Chin. Phys. Lett.  2002, Vol. 19 Issue (1): 134-136    DOI:
Original Articles |
Fabrication of Nanoparticle Pattern Through Atomic Force Microscopy Tip-Induced Deposition on Modified Silicon Surfaces
LIAO Jian-Hui;HUANG Lan;GU Ning
1National Laboratory of Molecular and Biomolecular Electronics, Southeast University, Nanjing 210096 2Center for Nano-Scale Scicence and Technology, Southeast University, Nanjing 210096
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LIAO Jian-Hui, HUANG Lan, GU Ning 2002 Chin. Phys. Lett. 19 134-136
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Abstract With an atomic force microscopy (AFM) tip used as a “nib”and gold colloidal particles as “ink”, patterns of gold colloidal particles have been deposited successfully from AFM tip onto specific regions of silicon surfaces modified by bifunctional mercaptosilane, i.e. (3-mercaptopropyl)-triethoxysilane. This was used as an adhesion agent and can immobilize the nanoparticles delivered from AFM tip onto the substrate surface.
Keywords: 85.40.Sz      85.40.Hp      85.65.+h     
Published: 01 January 2002
PACS:  85.40.Sz (Deposition technology)  
  85.40.Hp (Lithography, masks and pattern transfer)  
  85.65.+h (Molecular electronic devices)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2002/V19/I1/0134
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