Chin. Phys. Lett.  2007, Vol. 24 Issue (10): 2873-2875    DOI:
Original Articles |
Influence of Vacuum Organic Contaminations on Laser-Induced Damage of 1064nm Anti-Reflective Coatings
CUI Yun1,2;LIU Shi-Jie1,2;HE Hong-Bo1;ZHAO Yuan-An1;SHAO Jian-Da1;FAN Zheng-Xiu1
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 2018002Graduate School of the Chinese Academy of Sciences, Beijing 100049
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CUI Yun, LIU Shi-Jie, HE Hong-Bo et al  2007 Chin. Phys. Lett. 24 2873-2875
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Abstract We investigate the influence of vacuum organic contaminations on laser-induced damage threshold (LIDT) of optical coatings. Anti-reflective (AR) coatings at 1064\,nm made by Ta2O5/SiO2 are deposited by the ion beam
sputtering method. The LIDTs of AR coatings are measured in vacuum and
in atmosphere, respectively. It is exhibited that contaminations in vacuum are easily to be absorbed onto optical surface because of lower pressure, and they become origins of damage, resulting in the decrease of LIDT from 24.5J/cm2 in air to 15.7J/cm2 in vacuum. The LIDT of coatings in vacuum has is slightly changed compared with the value in atmosphere after the organic contaminations are wiped off. These results indicate that organic contaminations are the main reason of the LIDT decrease in vacuum. Additionally, damage morphologies have distinct changes from vacuum to atmosphere because of the differences between the residual stress and thermal decomposability of filmy materials.
Keywords: 42.79.Wc      68.60.-p      78.67.Pt     
Received: 04 April 2007      Published: 20 September 2007
PACS:  42.79.Wc (Optical coatings)  
  68.60.-p (Physical properties of thin films, nonelectronic)  
  78.67.Pt (Multilayers; superlattices; photonic structures; metamaterials)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2007/V24/I10/02873
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Articles by authors
CUI Yun
LIU Shi-Jie
HE Hong-Bo
ZHAO Yuan-An
SHAO Jian-Da
FAN Zheng-Xiu
[1] Hossin A A and Dowdye E 2005 SPIE 5897 589705-1
[2] Allenspacher P, Riede W and Wernham D 2005 SPIE 5991599128-1
[3] Riede W and Allenspacher P 2004 Fifth InternationalConference on Space Optics (ICSO, Toulouse, France, 30 March--2 April2004) p 839
[4] Scurlock C 2005 SPIE 5647 82
[5] International Standard ISO 11254-1 2000 (Printed in Switzerland,ISO Copyright Office)
[6] NASA Reference Publication 1395 1997 (Virginia 23681-2199, NASACenter)
[7] Leplan H, Geenen B and Robic J Y 1994 SPIE 2253 1263
[8] Leplan H, Geenen B and Robic J Y 1995 J. Appl. Phys. 78 962
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