| Original Articles |
|
|
|
|
PHOTOACOUSTIC MEASUREMENT OF AMORPHOUS SEMICONDUCTOR SUPERLATTICE FILMS |
| FENG Xiaomei;LIU Xiangna;WANG Zhichao;QIU Shuye* |
| Physics Department and Institute of Solid State Physics, Nanjing University, Nanjing
*Institute of Acoustic, Nanjing University, Nanjing |
|
| Cite this article: |
|
FENG Xiaomei, LIU Xiangna, WANG Zhichao et al 1986 Chin. Phys. Lett. 3 481-484 |
|
|
|
Abstract We present here the first measurement of photoacoustic spectra (PAS) of a-Si:H/a-SiNx:H multilayers. By converting the PAS signal to absorption coefficient, the blue shift and the broadening of Urbach edge are explained as the results of quantum size effect in superlattice structure.
|
|
|
Published: 01 November 1986
|
|
|
|
|
|
|
Viewed |
|
|
|
Full text
|
|
|
|
|
Abstract
|
|
|
|
|
