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Profound Carrier-Envelope-Phase-Difference Effect on Photoionization Rate: Numerical Results on a Model Hydrogen Atom |
| ZHOU Yu1;ZHANG Gui-Zhong1;XIANG Wang-Hua1;W. T. Hill III2 |
| 1College of Precision Instrument and Optoelectronics Engineering, Tianjin University, Tianjin 300072
2Key Laboratory of Opto-Electronic Information Technical Science (Ministry of Education), Tianjin University, 300072
3Institute for Physical Science and Technology, University of Maryland at College Park, MD 20742, USA |
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| Cite this article: |
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ZHOU Yu, ZHANG Gui-Zhong, XIANG Wang-Hua et al 2005 Chin. Phys. Lett. 22 2230-2232 |
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Abstract We discuss importance of the carrier-envelope phase difference (CEPD) effect which would be encountered in real short laser pulses. By numerically simulating photoionization rate of a one-dimensional atomic hydrogen model irradiated by short light pulses, a profound CEPD effect on the photoionization rate is revealed, which might shed light on laser-atom interaction investigation. We also suggest that photoionization process might be exploited in return to measure CEPD values.
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| Keywords:
31.15.Qg
33.80.Rv
32.80.Rm
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Published: 01 September 2005
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| PACS: |
31.15.Qg
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33.80.Rv
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(Multiphoton ionization and excitation to highly excited states (e.g., Rydberg states))
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32.80.Rm
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(Multiphoton ionization and excitation to highly excited states)
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Abstract
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