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Effect of Growth Temperature on the Band Lineup of Ge/CdTe(111) Polar Interfaces |
BAN Da-yan1;FANG Rong-chuan1;JI XUE Jian-geng1;LU Er-dong2;XU Peng-shou2 |
1Department of Physics, 2National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026 |
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Cite this article: |
BAN Da-yan, FANG Rong-chuan, JI XUE Jian-geng et al 1997 Chin. Phys. Lett. 14 609-612 |
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Abstract By using synchrotron radiation photoelectron spectroscopy, the band lineup of Ge/CdTe (111) interfaces grown at different temperatures have been measured. Experimental studies show that the valence band offset of Ge/CdTe (111) interface grown at room temperature is 0.88 ± 0.1 eV, which agrees well with previously reported value. While as for the interface grown at 280°C, an obvious reduction of valence band offsets is observed and attributed to sthe effect of different interface dipole.
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Keywords:
73.20.At
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Published: 01 August 1997
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PACS: |
73.20.At
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(Surface states, band structure, electron density of states)
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