Chin. Phys. Lett.  1997, Vol. 14 Issue (8): 609-612    DOI:
Original Articles |
Effect of Growth Temperature on the Band Lineup of Ge/CdTe(111) Polar Interfaces
BAN Da-yan1;FANG Rong-chuan1;JI XUE Jian-geng1;LU Er-dong2;XU Peng-shou2
1Department of Physics, 2National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230026
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BAN Da-yan, FANG Rong-chuan, JI XUE Jian-geng et al  1997 Chin. Phys. Lett. 14 609-612
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Abstract By using synchrotron radiation photoelectron spectroscopy, the band lineup of Ge/CdTe (111) interfaces grown at different temperatures have been measured. Experimental studies show that the valence band offset of Ge/CdTe (111) interface grown at room temperature is 0.88 ± 0.1 eV, which agrees well with previously reported value. While as for the interface grown at 280°C, an obvious reduction of valence band offsets is observed and attributed to sthe effect of different interface dipole.
Keywords: 73.20.At     
Published: 01 August 1997
PACS:  73.20.At (Surface states, band structure, electron density of states)  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1997/V14/I8/0609
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BAN Da-yan
FANG Rong-chuan
JI XUE Jian-geng
LU Er-dong
XU Peng-shou
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