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Focusing Properties of Fractal Zone Plates with Variable Lacunarity: Experimental Studies Based on Liquid Crystal on Silicon |
| DAI Hai-Tao;WANG Xin;XU Ke-Shu |
| State Key Laboratory for Advanced Photonic Materials and Devices, Department of Optical Science and Engineering, Fudan University, Shanghai 200433 |
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| Cite this article: |
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DAI Hai-Tao, WANG Xin, XU Ke-Shu 2005 Chin. Phys. Lett. 22 2851-2854 |
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Abstract The focusing properties of fractal zone plates (FZPs) with different structure parameters are studied experimentally. The axial irradiance of FZPs is deduced at n=4. The experimental results are in good agreement with the theoretical prediction. A method to fabricate FZPs with variable structure parameters is mentioned, and the liquid-crystal-on-silicon device is used to implement this experiment. The experimental results indicate that the focal depth of lower order FZPs is larger than that of higher order FZPs.
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| Keywords:
42.79.Hp
42.79.Ls
42.30.Kq
42.25.Fx
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Published: 01 November 2005
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| PACS: |
42.79.Hp
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(Optical processors, correlators, and modulators)
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42.79.Ls
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(Scanners, image intensifiers, and image converters)
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42.30.Kq
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(Fourier optics)
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42.25.Fx
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(Diffraction and scattering)
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