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Structural and Critical Behaviors of Ag Rough Films Deposited on Liquid Substrates |
YE Gao-xiang1,2;FENG Chun-mu2;ZHANG Qi-rui2;GE Hong-liang2;ZHANG Xuan-jia2 |
1Department of Physics, Hangzhou University, Hangzhou 310028
2Department of Physics, Zhejiang University, Hangzhou 310027
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Cite this article: |
YE Gao-xiang, FENG Chun-mu, ZHANG Qi-rui et al 1996 Chin. Phys. Lett. 13 772-774 |
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Abstract A new Ag rough film system, deposited on silicone oil surfaces by rf-magnetron sputtering method, has been fabricated. The chrysanthemum-like surface morphology at micron length scale is observed. It is proposed that the anomalous critical behavior mainly results from the relative shift between the Ag atom clusters and the substrate. The discussion of the deposition mechanism is also presented.
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Keywords:
64.60.Ak
73.61.At
68.90.+g
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Published: 01 October 1996
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PACS: |
64.60.Ak
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73.61.At
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(Metal and metallic alloys)
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68.90.+g
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(Other topics in structure, and nonelectronic properties of surfaces and interfaces; thin films and low-dimensional structures)
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