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Studies of Spectroscopic Ellipsometry in Cd1-xMnxTe/CdTe Superlattices
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| CHEN Chen-Jia1;WANG Xue-Zhong1;Vittorio BELLANI2;Angiolino STELLA2 |
| 1School of Physics, Peking University, Beijing 100871
2Consorzio Nazionale Interuniversitario per le Scienze Fisiche della Materia (CNISM) and Dipartimento di Fisica "A.Volta", University degli Studi di Pavia, 27100 Pavia, Italy |
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| Cite this article: |
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CHEN Chen-Jia, WANG Xue-Zhong, Vittorio BELLANI et al 2006 Chin. Phys. Lett. 23 207-210 |
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Abstract Cd1-xMnxTe/CdTe superlattices and thin films were grown by molecular beam epitaxy on GaAs (001) substrates. Spectroscopic ellipsometry measurements were performed on Cd1-xMnxTe/CdTe superlattices with compositions x=0.4, 0.8, and Cd1-xMnx thin films with x=0.2, 0.4, 0.6 at room temperature in the photon energy range 1.4--5eV. In superlattices the pseudodielectric functions measured by ellipsometry show specific features related to the exciton transition between quantized interbands. The exciton transitions related to the heavy holes of 11H, 22H, and 33H are observed and identified. In thin films spectroscopic ellipsometry allows the clear identification of the energy gap E0. Additionally, critical point transitions are observable in both the spectra of the superlattices and films. Photoreflectance spectra were also performed at room temperature in order to compare with our ellipsometry results. After taking into account the strain-induced and quantum confinement effects, the theoretical calculations are in good agreement with our experimental spectra. Ellipsometry appears to be a suited technique to monitor the MBE growth, ultimately also in situ, of diluted magnetic low-dimensional systems.
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| Keywords:
78.67.Pt
78.66.Hf
78.20.Ci
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Published: 01 January 2006
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| PACS: |
78.67.Pt
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(Multilayers; superlattices; photonic structures; metamaterials)
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78.66.Hf
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(II-VI semiconductors)
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78.20.Ci
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(Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity))
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