Chin. Phys. Lett.  2004, Vol. 21 Issue (3): 524-526    DOI:
Original Articles |
Threshold of Non-Destructive Pulse for Pt Tip of STM on Graphite Surface
XU Chun-Kai1;WEI Zheng1;CHEN Xiang-Jun1;XU Ke-Zun1;HUANG Wen-Hao2
1Laboratory of Bond-Selective Chemistry, Laboratory of Atomic and Molecular Physics, Department of Modern Physics, University of Science and Technology of China, Hefei 230027 2Department of Precision Machinery and Instrumentation, University of Science and Technology of China, Hefei 230027
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XU Chun-Kai, WEI Zheng, CHEN Xiang-Jun et al  2004 Chin. Phys. Lett. 21 524-526
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Abstract The experimental relationship between width and amplitude of the non-destructive threshold pulse for Pt tip of a scanning tunnelling microscope (STM) on graphite surface have been studied strictly and systematically in a wide range of pulse width for the first time. The threshold curve of amplitude versus width indicates that the amplitude of threshold pulse will increase with the decrease of the pulse width. A more rigorous explanation is suggested to interpret the dependence of threshold pulse amplitude on width. Fitted with the experimental data, a new empirical formula is given, extrapolated from which the threshold pulse amplitude will rise to 50 V when the pulse width decreases to 10 ns.

Keywords: 68.37.Ef      39.25.+k      61.46.+w     
Published: 01 March 2004
PACS:  68.37.Ef (Scanning tunneling microscopy (including chemistry induced with STM))  
  39.25.+k  
  61.46.+w  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y2004/V21/I3/0524
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XU Chun-Kai
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