Chin. Phys. Lett.  1999, Vol. 16 Issue (9): 675-676    DOI:
Original Articles |
Optical Absorption and X-Ray Diffraction Studies of Sulfur Under High Pressure
CHEN Liang-chen;WANG Li-jun
Institute of Physics, Chinese Academy of Sciences, Beijing 100080
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CHEN Liang-chen, WANG Li-jun 1999 Chin. Phys. Lett. 16 675-676
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Abstract In situ high pressure optical absorption measurements of sulfur have been carried out by using DAC device with a TASCO V-550 UV-VIS spectrophotometer at pressures up to 41.6GPa. The curves of absorption edge vs pressure were obtained, in which there are two turning points at about 5 and 12GPa, corresponding to two changes of colour in the optical observation: one is from yellow to red and the other from red to black at 5-6.5 and 10-12GPa, respectively. The absorption edge reaches above 800nm when the pressure is increased to 23GPa. The structure and phase transitions have also been investigated by using in situ high pressure energy-dispersive x-ray diffraction with synchrotron radiation at pressures up to 33.7GPa. No structure phase transition occurs at 5-6 GPa, but there is a new high-pressure phase, caused probably by the reorientation or ordering of S8.
Keywords: 62.50.+p      64.70.-p      78.20.-e      61.10.-i     
Published: 01 September 1999
PACS:  62.50.+p  
  64.70.-p (Specific phase transitions)  
  78.20.-e (Optical properties of bulk materials and thin films)  
  61.10.-i  
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https://cpl.iphy.ac.cn/       OR      https://cpl.iphy.ac.cn/Y1999/V16/I9/0675
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