Direct Experimental Evidence of Hole Trapping in Negative Bias Temperature Instability Support info


	2011, Vol. 28(10): 107302-107302 DOI: 10.1088/0256-307X/28/10/107302

	Direct Experimental Evidence of Hole Trapping in Negative Bias Temperature Instability
	JI Xiao-Li¹, LIAO Yi-Ming¹, YAN Feng^1**, SHI Yi¹, ZHANG Guan², GUO Qiang²
	¹Institute of Electronics Science and Engineering, Nanjing University, Nanjing 210093 ²QRE/Reliability Engineering, SMIC, 18 Wenchang Road, BDA, Beijing 100176
	收稿日期 2011-06-28 修回日期 1900-01-01
	Supporting info


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