2011, Vol. 28(6): 64211-064211    DOI: 10.1088/0256-307X/28/6/064211
Comparative Studies on the Laser Damage Resistance of Ta2O5 and Nb2O5 Films Performed under Different Electron Beam Currents
XU Cheng1,2**, XU Lin-Min1, ZHANG Han-Zhuo1, QIANG Ying-Huai1, ZHU Ya-Bo1, LIU Jiong-Tian2, SHAO Jian-Da3
1School of Materials Science and Engineering, China University of Mining and Technology, Xuzhou 221116
2School of Chemical Engineering and Technology, China University of Mining and Technology, Xuzhou 221116
3Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800
收稿日期 2010-12-03  修回日期 1900-01-01
Supporting info
[1] Wolfe C R et al 1989 Proc. SPIE 1438 360
[2] Xu C, Ma J et al 2008 Chin. Phys. Lett. 25 1321
[3] Xu C, Qiang Y et al 2010 Opt. Laser Technol. 42 497
[4] Manifacier J C et al 1976 J. Phys. E: Sci. Instrum. 9 1002
[5] He H B et al 2005 Proc. SPIE 5991 59912F
[6] Zhao Y A et al 2003 Appl. Surf. Sci. 210 353
[7] Hu H, Fan Z and Luo F 2001 Appl. Opt. 40 1950
[8] ISO 11254-1:2000: Lasers and Laser-Related Equipment–Determination of Laser-Induced Damage Threshold of Optical Surfaces (Washington DC: American National Standards Instigute) part 1
[9] Masse J -P et al 2006 Thin Solid Films 515 1674
[10] Atuchin V V et al 2009 Chem. Phys. 360 74
[11] Atuchin V V et al 2008 J. Solid State Chem. 181 1285
[12] Zhang D P et al 2006 Opt. Laser Technol. 38 654
[13] Xu C, Qiang Y et al 2010 Vacuum 84 1310
[14] Jones S C et al 1989 Opt. Eng. 28 1039
[15] Abromavicius G et al 2006 Proc. SPIE 6403 640315