2011, Vol. 28(5): 53201-053201    DOI: 10.1088/0256-307X/28/5/053201
A Phenomenological Model for Decay Process of Long-Persistent Phosphorescence
CHEN Bin1, HAO Hong-Chen2, ZHU Jiang2, LU Ming2**
1Department of Physics, Fudan University, Shanghai 200433
2Department of Optical Science and Engineering, Fudan University, Shanghai 200433
收稿日期 2011-03-02  修回日期 1900-01-01
Supporting info
[1] Matsuzawa T, Aoki Y, Takeuchi N and Murayama Y 1996 J. Electrochem. Soc. 143 2670
[2] Sakai R, Katsumata T and Momuro T 1999 J. Lumin. 85 149
[3] Aizawa H, Komuro S, Katsumata T, Sato S and Morikawa T 2006 Thin Solid Films 496 179
[4] Dorenbos P 2007 J. Lumin. 122–123 315
[5] Chen R, Wang Y, Hu Y, Hu Z and Liu C 2008 J. Lumin. 128 1180
[6] Lin L, Shi C, Wang Z, Zhang W and Yin M 2008 J. Alloys Compd. 466 546
[7] Chang C, Li W, Huang X, Wang Z, Chen X, Qian X, Guo R, Ding Y and Mao D 2010 J. Lumin. 130 347
[8] Hao H, Chen B, Zhu J and Lu M 2011 Chin. J. Lumin. 32 60 (in Chinese)