2011, Vol. 28(4): 43402-043402    DOI: 10.1088/0256-307X/28/4/043402
	Second Harmonic Generation in Scanning Probe Microscopy for Edge Localization
	HU Xiao-Gen**, LI Yu-He**, LIN Hao-Shan, WANG Dong-Sheng, QI Xin
	State Key Laboratory of Precision Measurement Technology and Instruments, Department of Precision Instruments and Mechanology, Tsinghua University, Beijing 100084
	收稿日期 2010-09-15  修回日期 1900-01-01
	Supporting info
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