2011, Vol. 28(1): 17301-017301    DOI: 10.1088/0256-307X/28/1/017301
	Negative Bias Temperature Instability
	CAO Yan-Rong1**, MA Xiao-Hua2, HAO Yue3, ZHU Min-Bo1, TIAN Wen-Chao1, ZHANG Yue3
	1School of Electronical and Machanical Engineering, Xidian University, Xi'an 710071 2School of Technical Physics, Xidian University, Xi'an 710071 3Key Lab of Wide Band-Gap Semiconductor Materials and Devices, Xi'an 710071
	收稿日期 2010-08-03  修回日期 1900-01-01
	Supporting info
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