2011, Vol. 28(1): 12901-012901    DOI: 10.1088/0256-307X/28/1/012901
	Computerized Control and Operation of Rutherford Backscattering/Channeling for an in situ Ion Beam System and Its Application for Measurement of Si(001) and ZnO(001)
	HE Jun1, J. C. LEE2, LI Ming1, WANG Ze-Song1, LIU Chuan-Sheng1, FU De-Jun1**
	1Accelerator Laboratory, Wuhan University, Wuhan 430072 2Quantum-Functional Semiconductor Research Center, Dongguk University, 3-26 Pildong, Seoul 100-715, Korea
	收稿日期 2010-07-26  修回日期 1900-01-01
	Supporting info
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