[1] Khounsary A, Fernandez P, Assoufid L and Schwartz J 2002
Rev. Sci. Instrum. 73 1537

[2] Johnson J S, Grobsky K and Bray D J 2002 Proc.
SPIE. 4771 243

[3] Ebizuka N, Dai Y, Eto H, Handa T, Takami H and Takahashi
Y 2003 Proc. SPIE. 842 329

[4] Zhang Y M, Zhang J H, Han J C, He X D and Yao W 2004
Mater. Lett. 58 1024

[5] Br\"{uggemann R, Reinig P and H\"{olling M 2003
Thin Solid Films 427 358

[6] Dericioglu A F and Kagawa Y 2003 J. Eur. Ceram. Soc.
23 951

[7] Lai F C, Li M, Wang H Q, Hu H L, Wang X P, Hou J G, Song
Y Z and Jiang Y S 2005 Thin Solid Films 448 314

[8] Guinneton F, Valmalette J C and Gavarri J R 2000
Opt. Mater. 15 111

[9] Guinneton F, Sauques L, Valmalette J C, Cros F and
Gavarri J R 2005 J. Phys. Chem. Solids 66 63

[10] Koo W H, Lee S J, Lee S M, Jeong S M, Choi S H and Baik H
K 2004 J. Vac. Sci. Technol. A 22 2048