| 2009, Vol. 26(11): 114210-114210 DOI: 10.1088/0256-307X/26/11/114210 | ||
| Measurement of Refractive Index for High Reflectance Materials with Terahertz Time Domain Reflection Spectroscopy | ||
| SUN Wen-Feng1, WANG Xin-Ke2, ZHANG Yan1 | ||
| 1Beijing Key Lab for Terahertz Spectroscopy and Imaging, Key Laboratory of Terahertz Optoelectronics (Ministry of Education), Department of Physics, Capital Normal University, Beijing 1000482Department of Physics, Harbin Institute of Technology, Harbin 150001 | ||
| 收稿日期 2009-08-11 修回日期 1900-01-01 | ||
| Supporting info | ||
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