2011, Vol. 28(7): 70701-070701    DOI: 10.1088/0256-307X/28/7/070701
	Enhanced Total Ionizing Dose Susceptibility in Narrow Channel Devices
	LIU Zhang-Li1,2**, HU Zhi-Yuan1,2, ZHANG Zheng-Xuan1, SHAO Hua, NING Bing-Xu1,2, BI Da-Wei1, CHEN Ming1,2, ZOU Shi-Chang1
	1The State Key Laboratory of Functional Materials for Informatics, Shanghai Institute of Microsystem and Information Technology, Chinese Academy of Sciences, Shanghai 200050 2Graduate University of the Chinese Academy of Sciences, Beijing 100049
	收稿日期 2011-03-18  修回日期 1900-01-01
	Supporting info
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