2008, Vol. 25(9): 3433-3435    DOI:
Influence of Ytterbia Content on Residual Stress and Microstructure of Y2O3--ZrO2 Thin Films Prepared by EB-PVD
XIAO Qi-Ling1,2, SHAO Shu-Ying1, HE Hong-Bo1, SHAO Jian-Da1, FAN Zheng-Xiu1
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 2018002Graduate School of the Chinese Academy of Sciences, Beijing 100039
收稿日期 2008-02-28  修回日期 1900-01-01
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