2008, Vol. 25(9): 3433-3435 DOI: | ||
Influence of Ytterbia Content on Residual Stress and Microstructure of Y2O3--ZrO2 Thin Films Prepared by EB-PVD | ||
XIAO Qi-Ling1,2, SHAO Shu-Ying1, HE Hong-Bo1, SHAO Jian-Da1, FAN Zheng-Xiu1 | ||
1Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, PO Box 800-211, Shanghai 2018002Graduate School of the Chinese Academy of Sciences, Beijing 100039 | ||
收稿日期 2008-02-28 修回日期 1900-01-01 | ||
Supporting info | ||
[1] Krishna M G et al 1992 J. Vac. Sci. Technol. A [2] Lubig A et al 1992 Thin Solid Films 217 125 [3] Boulouz M et al 1999 Mater. Sci. Eng. B 67 122 [4] Fukutomi M et al 1994 Thin Solid Films 239 123 [5] Ritala M and Leskela M 1994 Appl. Surf. Sci. 75 [6] Chang J T et al 2005 Surf. Coating Technol. 200 [7] Physica C 1997 Superconductivity 282 611 [8] Scardi Paolo, Leoni Matteo and Bertamini Luca 1996 [9] Sprio S, Guicciardi S, Bellosi A and G. Pezzotti 2006 [10] Scardi P, Leoni M, Bertini L and Bertamini L. 1997 [11] Clyne T W, Gill S C and Thermal J 1996 Spray. [12] Kesler O, Finot M, Suresh S and Sampath S 1997 Acta [13] Leplan H, Robic J Y and Pauleau Y 1996 J. Appl. [14] Shao S Y, Fan Z X, Fan R Y and Shao J D 2004 Acta [15] Morrell R 1985 Handbook of Properties of Technical [16] Chaudhari P 1974 J. Vac. Res. 11 131 |
||