2010, Vol. 27(7): 74215-074215    DOI: 10.1088/0256-307X/27/7/074215
Laser Resistance of Ta2O5/SiO2 and ZrO2/SiO2 Optical Coatings under 2μm Femtosecond Pulsed Irradiation

LIU Na1,2, WANG Ying-Jian1, ZHOU Ming1,2, JING Xu-Feng1,2, WANG Yan-Zhi1,2, CUI Yun1, JIN Yun-Xia1

1Key Laboratory of Materials for High Power Laser, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800 2Graduate School of Chinese Academy of Sciences, Beijing 100049
收稿日期 2010-04-14  修回日期 1900-01-01
Supporting info

[1] Wang Q et al 2009 Opt. Lett. 34 3616
[2] Mackenzie J I et al 2001 Electron. Lett. 37 898
[3] Wang D L et al 2001 Chin. Phys. Lett. 18 65
[4] Xu C et al 2008 Chin. J. Lasers 35 1595(in Chinese)
[5] Cho H J and Hwangbo C K 1996 Appl. Opt. 35 5545
[6] ISO 11254-2:2000 Laser and Laser-Related Equipment: Determination of Laser-Induced Damage Threshold of Optical Surface part 2: S-on-1 test
[7] Ben-Yakar A and Byer R L 2004 J. Appl. Phys. 96 5316
[8] Weber M J 2002 Handbook of Optical Materials (New York: Baker and Taylor)
[9] Yuan L et al 2007 J. Opt. Soc. Am. B 24 538
[10] Mero M, Liu J and Rudolph W 2005 Phys. Rev. B 71 115
[11] Yuan L, Zhao Y A, He H B and Shao J D 2007 Chin. Opt. Lett. 5 S257
[12] H A Macleod 1986 Thin-Film Optical Filters (Bristol: IOP) p 462
[13] Hale G M and Querry M R 1973 Appl. Opt. 12 555
[14] Tang J F, Gu P F, Liu X and Li H F 2006 Modern Optical Thin Film Technology (Hangzhou: Zhejiang University Press) p 325 (in Chinese)
[15] Keldysh L V 1965 Sov. Phys. JETP 20 1307
[16] Starke K et al 2004 Proc. SPIE 5273 501
[17] Jupé M et al 2009 Opt. Express 17 12269
[18] Li M et al 1999 Phys. Rev. Lett. 82 2394
[19] Gruzdev V E 2005 Proc. SPIE 5647 480
[20] Sudrie L et al 2002 Phys. Rev. Lett. 89 186601