2007, Vol. 24(9): 2704-2706    DOI:
Electrical Characterization of Copper Phthalocyanine Thin-Film Transistors with Fluoride Gate Insulator
YU Shun-Yang1,2, YI Ming-Dong1, MA Dong-Ge1
1State Key Laboratory of Polymer Physics and Chemistry, Changchun Institute of Applied Chemistry, Chinese Academy of Sciences, Changchun 1300222Graduate School of the Chinese Academy of Sciences, Beijing 100049
收稿日期 2007-03-02  修回日期 1900-01-01
Supporting info

[1] Bao Z, Lovinger A J and Dodabalapur A 1996 Appl. Phys. Lett.
69 3066

[2] Lee J, Hwang D K, Choi J M, Lee K, Kim J H and Im S, Park J H and
Kim E 2005 Appl. Phys. Lett. 87 023504

[3] Jang Y, Kim D H, Park Y D, Cho J H, Hwang M and Cho K 2006
Appl. Phys. Lett. 88 072101

[4] Gelinck G H, Huitema H E A et al 2004 Nature Mater.
3 106

[5] Gundlach D J and Jackson T N 1999 Appl. Phys. Lett.
74 3302

[6] Sze S M 1981 Physics of Semiconductor Devices (New York:
Wiley)

[7] Parker I D 1994 J. Appl. Phys. 75 1656

[8] de Boer R W I, Stassen A F, Craciun M F, Mulder C L, Molinari A,
Rogge S and Morpurgo A F 2005 Appl. Phys. Lett. 86 262109

[9] Chua L L, Zaumseil J, Chang J F, Ou E C W, Ho P K H, Sirringhaus H
and Friend Richard H 2005 Nature 434 194

[10] Horowitz G, Hajlaoui M E and Hajlaoui R 2000 J. Appl. Phys.
87 4456

[11]Yu S Y, Yi M D and Ma D G 2006 Semicond. Sci. Technol.
21 1452

[12] Dimitrakopoulos C D, Purushothaman S, Kymissis J, Callegari A and
Shaw J M 1999 Science 283 822