2008, Vol. 25(4): 1380-1383 DOI: | ||
Thickness Dependence of Resistivity and Optical Reflectance of ITO Films | ||
GAO Mei-Zhen1,2, JOB R2, XUE De-Sheng1, FAHRNER W R2 | ||
1Key Lab for Magnetism and Magnetic Materials of the Ministry of Education, Lanzhou University, Lanzhou 7300002Department of Electronic Devices, Faculty of Electrical Engineering, University of Hagen, Haldener Str. 182, D-58084 Hagen, Germany | ||
收稿日期 2007-10-23 修回日期 1900-01-01 | ||
Supporting info | ||
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