2008, Vol. 25(2): 743-746    DOI:
Determination of Thickness and Optical Constants of ZnO Thin Films Prepared by Filtered Cathode Vacuum Arc Deposition

WANG Ming-Dong1, ZHU Dao-Yun2, LIU Yi3, ZHANG Lin1, ZHENG Chang-Xi1, HE Zhen-Hui1, CHEN Di-Hu1, WEN Li-Shi1

1State Key Laboratory of Optoelectronic Materials and Technologies, and Department of Physics, School of Physics and Engineering, Sun Yat-Sen University, Guangzhou 5102752Experiment Center, Guangdong University of Technology, Guangzhou 5100903School of Physical Science, Shenzhen University, Shenzhen 518060
收稿日期 2007-04-04  修回日期 1900-01-01
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