Ion Photon Emission Microscope for Single Event Effect Testing in CIAE
Yan-Wen Zhang, Gang Guo** , Jian-Cheng Liu, Shu-Ting Shi, Ying-Can Qin, Li-Li Li, Lin-Feng He
Department of Nuclear Physics, China Institute of Atomic Energy, Beijing 102413
Abstract ：Ion photon emission microscopy (IPEM) is a new ion-induced emission microscopy. It employs a broad ion beam with high energy and low fluence rate impinging on a sample. The position of a single ion is detected by an optical system with objective lens, prism, microscope tube and charge coupled device (CCD). A thin ZnS film doped with Ag ions is used as a luminescent material. Generation efficiency and transmission efficiency of photons in the ZnS(Ag) film created by irradiated Cl ions are calculated. A single Cl ion optical microscopic image is observed by high quantum efficiency CCD. The resolution of a single Cl ion given in this IPEM system is 6 μm. Several factors influencing the resolution are discussed. A silicon diode is used to collect the electrical signals caused by the incident ions. Effective and accidental coincidence of optical images and electronic signals are illustrated. A two-dimensional map of single event effect is drawn out according to the data of effective coincidence.
收稿日期: 2017-02-27
出版日期: 2017-06-23
:
34.50.Bw
(Energy loss and stopping power)
34.50.Gb
(Electronic excitation and ionization of molecules)
79.20.Rf
(Atomic, molecular, and ion beam impact and interactions with surfaces)
引用本文:
. [J]. 中国物理快报, 2017, 34(7): 73401-.
链接本文:
https://cpl.iphy.ac.cn/CN/10.1088/0256-307X/34/7/073401
或
https://cpl.iphy.ac.cn/CN/Y2017/V34/I7/73401
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