Molecular Beam Epitaxy of GaSb on GaAs Substrates with Compositionally Graded LT-GaAs$_{x}$Sb$_{1-x}$ Buffer Layers
Hai-Long Yu, Hao-Yue Wu, Hai-Jun Zhu, Guo-Feng Song, Yun Xu**
Nano-Optoelectronics Laboratory, Institute of Semiconductors, Chinese Academy of Sciences, Beijing 100083
Abstract :We investigate the molecular beam epitaxy growth of GaSb films on GaAs substrates using compositionally graded GaAs$_{x}$Sb$_{1-x}$ buffer layers. Optimization of GaAs$_{x}$Sb$_{1-x}$ growth parameter is aimed at obtaining high GaSb crystal quality and smooth GaSb surface. The optimized growth temperature and thickness of GaAs$_{x}$Sb$_{1-x}$ layers are found to be 420$^\circ\!$C and 0.5 μm, respectively. The smallest full width at half maximum value and the root mean square surface roughness of 0.67 nm over $2\times2$ μm$^{2}$ area are achieved as a 250 nm GaSb film is grown under optimized conditions.
收稿日期: 2016-08-11
出版日期: 2016-12-29
:
81.05.Ea
(III-V semiconductors)
81.10.Pq
(Growth in vacuum)
74.78.Fk
(Multilayers, superlattices, heterostructures)
81.15.-z
(Methods of deposition of films and coatings; film growth and epitaxy)
[1] Chow D H, Miles R H, Soderstrom J R et al 1990 Appl. Phys. Lett. 56 1418 [2] Chang C P, Chen J, Fernandez J M et al 1992 Appl. Phys. Lett. 60 1129 [3] Watkins S P, Ares R, Soerensen G et al 1997 J. Cryst. Growth 170 788 [4] Zhang X B, Ryou J H, Dupuis R D et al 2006 Appl. Phys. Lett. 88 072104 [5] Mohseni H, Tahraoui A, Wojkowski J S, Razeghi M, Mitchel W and Saxler A 2000 Proc. SPIE 3948 145 [6] Morosini M B, Gerrera-Perez J L, Loural M S et al 1993 IEEE J. Quantum Electron. 29 2103 [7] Staveteig P T, Choi Y H, Labeyrie G et al 1994 Appl. Phys. Lett. 64 460 [8] Brar B and Leonard D 1995 Appl. Phys. Lett. 66 463 [9] Brown S J, Grimshaw M P, Ritchie D A et al 1996 Appl. Phys. Lett. 69 1468 [10] Akahane K, Yamamoto N, Gozu S et al 2004 J. Cryst. Growth 264 21 [11] Muller K L, Heitz R, Schliwa Aa et al 2001 Appl. Phys. Lett. 78 1418 [12] Muller K L, Heitz R and Pohl U W 2001 Appl. Phys. Lett. 79 1027 [13] Chang J C P, Chen J, Fernandez J M, Wieder H H and Kavanagh K L 1992 Appl. Phys. Lett. 60 1129 [14] Jayavel P, Nakamura S, Koyama T and Hayakawa Y 2006 Phys. Status Solidi C 3 2685 [15] Xin Y C, Vaughn L G, Dawson L R, Stintz A, Lin Y, Lester L F and Huffaker D L 2003 J. Appl. Phys. 94 2133 [16] Qian W, Skowronski M and Kaspi R 1997 J. Electrochem. Soc. 144 1430 [17] Chow D H, Miles R H, Soderstrom J R and McGill T C 1990 Appl. Phys. Lett. 56 1418 [18] Zhang X B, Ryou J H, Dupuis R D, Petschke A, Mou S, Chuang S L, Xu C and Hsieh K C 2006 Appl. Phys. Lett. 88 072104 [19] Lee W, Kim S, Choi S, Lee H, Lee S, Park S, Yao T, Song J, Ko H and Chang J 2007 J. Cryst. Growth 305 40 [20] Kanisawa K, Yamaguchi H and Hirayama Y 2000 Appl. Phys. Lett. 76 589 [21] Nishimura T, Kadoiwa K, Hayafuji N, Miyashita M, Mitsui K, Kumabe H and Murotani T 1991 J. Cryst. Growth 107 468 [22] Takano Y, Sasaki T, Nagaki Y, Kuwahara K et al 1996 J. Cryst. Growth 169 621 [23] Wen L, Gao F L, Zhang X N, Zhang S G et al 2014 J. Appl. Phys. 116 193508 [24] Gao F L, Wen L, Zhang S G, Li J L, Zhang X N et al 2015 Thin Solid Films 597 25 [25] Zhou Z Q, Xu Y Q, Hao R T, Tang B, Ren Z W and Niu Z C 2009 Chin. Phys. Lett. 26 018101 [26] Sun Q L, Wang L, Wang W Q, Sun L, Li M C, Wang W X et al 2015 Chin. Phys. Lett. 32 106801 [27] Watkins S P, Ares R, Soerensen G, Zhong W, Tran C A et al 1997 J. Cryst. Growth 170 788 [28] Kim H S, Noh Y K, Kim M D, Kwon Y J, Oh J E et al 2007 J. Cryst. Growth 301 230
[1]
. [J]. 中国物理快报, 2022, 39(5): 58101-058101.
[2]
. [J]. 中国物理快报, 2021, 38(6): 68101-.
[3]
. [J]. 中国物理快报, 0, (): 68503-.
[4]
. [J]. 中国物理快报, 2020, 37(6): 68503-.
[5]
. [J]. 中国物理快报, 2020, 37(5): 54204-.
[6]
. [J]. 中国物理快报, 2020, 37(3): 38102-.
[7]
. [J]. 中国物理快报, 2020, 37(3): 38502-.
[8]
. [J]. 中国物理快报, 2018, 35(9): 98101-.
[9]
. [J]. 中国物理快报, 2018, 35(7): 78801-.
[10]
. [J]. 中国物理快报, 2018, 35(5): 57801-.
[11]
. [J]. 中国物理快报, 2018, 35(3): 38103-.
[12]
. [J]. 中国物理快报, 2018, 35(2): 26104-.
[13]
. [J]. 中国物理快报, 2017, 34(5): 58101-.
[14]
. [J]. 中国物理快报, 2017, 34(4): 48101-048101.
[15]
. [J]. 中国物理快报, 2016, 33(12): 128101-128101.