Imaging Ultrafast Plasmon Dynamics within a Complex Dolmen Nanostructure Using Photoemission Electron Microscopy
Jiang Qin1 , Peng Lang1 , Bo-Yu Ji1 , N. K. Alemayehu1 , Han-Yan Tao1 , Xun Gao1 , Zuo-Qiang Hao1** , Jing-Quan Lin1,2**
1 School of Science, Changchun University of Science and Technology, Changchun 1300222 International Research Center for Nano Handling and Manufacturing of China, Changchun University of Science and Technology, Changchun 130022
Abstract :We report direct nanoscale imaging of ultrafast plasmon in a gold dolmen nanostructure excited with the 7 fs laser pulses by combining the interferometric time-resolved technology with the three-photon photoemission electron microscopy (PEEM). The interferometric time-resolved traces show that the plasmon mode beating pattern appears at the ends of the dimer slabs in the dolmen nanostructure as a result of coherent superposition of multiple localized surface plasmon modes induced by broad bandwidth of the ultrafast laser pulses. The PEEM measurement further discloses that in-phase of the oscillation field of two neighbor defects are surprisingly observed, which is attributed to the plasmon coupling between them. Furthermore, the control of the temporal delay between the pump and probe laser pluses could be utilized for manipulation of the near-field distribution. These findings deepen our understanding of ultrafast plasmon dynamics in a complex nanosystem.
收稿日期: 2016-08-31
出版日期: 2016-11-28
:
68.37.Xy
(Scanning Auger microscopy, photoelectron microscopy)
78.47.J-
(Ultrafast spectroscopy (<1 psec))
78.67.Bf
(Nanocrystals, nanoparticles, and nanoclusters)
42.65.Re
(Ultrafast processes; optical pulse generation and pulse compression)
引用本文:
. [J]. 中国物理快报, 2016, 33(11): 116801-116801.
Jiang Qin, Peng Lang, Bo-Yu Ji, N. K. Alemayehu, Han-Yan Tao, Xun Gao, Zuo-Qiang Hao, Jing-Quan Lin. Imaging Ultrafast Plasmon Dynamics within a Complex Dolmen Nanostructure Using Photoemission Electron Microscopy. Chin. Phys. Lett., 2016, 33(11): 116801-116801.
链接本文:
https://cpl.iphy.ac.cn/CN/10.1088/0256-307X/33/11/116801
或
https://cpl.iphy.ac.cn/CN/Y2016/V33/I11/116801
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