A New Simulation of Track Structure of Low-Energy Electrons in Liquid Water: Considering the Condensed-Phase Effect on Electron Elastic Scattering
Wei Liu1, Zhen-Yu Tan1**, C. Champion2
1School of Electrical Engineering, Shandong University, Jinan 250061 2Centre d'Etudes Nucléaires de Bordeaux Gradignan, Université de Bordeaux, Gradignan 33175, France
Abstract：A new Monte Carlo simulation of the track structure of low-energy electrons ($ < $10 keV) in liquid water is presented. The feature of the simulation is taken into consideration of the condensed-phase effect of liquid water on electron elastic scattering with the use of the Champion model, while the dielectric response formalism incorporating the optical-data model developed by Emfietzoglou et al. is applied for calculating the electron inelastic scattering. The spatial distributions of energy deposition and inelastic scattering events of low-energy electrons with different primary energies in liquid water are calculated and compared with other theoretical evaluations. The present work shows that the condensed-phase effect of liquid water on electron elastic scattering may be of the influence on the fraction of absorbed energy and distribution of inelastic scattering events at lower primary energies, which also indicate potential effects on the DNA damage induced by low-energy electrons.
(Theory of impact phenomena; numerical simulation)
引用本文:
. [J]. 中国物理快报, 2016, 33(09): 93401-093401.
Wei Liu, Zhen-Yu Tan, C. Champion. A New Simulation of Track Structure of Low-Energy Electrons in Liquid Water: Considering the Condensed-Phase Effect on Electron Elastic Scattering. Chin. Phys. Lett., 2016, 33(09): 93401-093401.
Champion C, Incerti S, Perrot Y, Delorme R, Bordage M C, Bardies M, Mascialino B, Tran H N, Ivanchenko V, Bernal M, Francis Z, Groetz J E, Fromm M and Campos L 2014 Appl. Radiat. Isot.83 137
Jablonski A, Salvat F and Powell C J 2003 NIST Electron. Elastic-Scattering Cross-Sec. Database-Version 3. 1[DB] (Gaithersburg: National Institute of Standards and Technology)
2016, Vol. 33 
