The V(z) Inversion Technique for Evaluation of an Adhesively Bonded Structure
LIU Jing1,2,3, XU Wei-Jiang1**, HU Wen-Xiang2, OURAK Mohamed1, DUBOIS Andre3
1Institut d'Electronique de Microélectronique et de Nanotechnologie, UMR CNRS 8520, Département DOAE, Université de Valenciennes, Valenciennes 59313, France 2Institute of Acoustics, Tongji University, Shanghai 200092 3Laboratoire d'Automatique de Mécanique et d'Informatique Industrielles et Humaines, UMR CNRS 8201, Université de Valenciennes, Valenciennes 59313, France
Based on the fact that the evolution trace in incident angle and frequency of the resonance zeros of the reflection coefficient function for a water charged layered medium is equivalent to its guided wave mode dispersion, the interfacial adhesion of a three-layer aluminum–adhesive–aluminum bonding structure is characterized nondestructively by determining the interface shear stiffness kt associated with the interfacial strength. The resonance reflection function is obtained experimentally by the V(z) inversion technique using an ultrasonic focused transducer of wide-band and large angular aperture (up to ±45°). The dispersion curves are numerically calculated, adjusting the parameter kt so that the difference between the dispersion curves and the angular-frequency tracing of the reflection zeros is minimum. The parameter kt at an interface of weakly adhered aluminum epoxy-resin is estimated to be 1014 N/m3.
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