Ultrafast Imaging of Electronic Relaxation in Ortho-xylene: New Features from Fragmentation-Ion Spectroscopy
LIU Yu-Zhu1**, KNOPP Gregor2, XIAO Shao-Rong1, GERBER Thomas2
1College of Physics and Opto-electronics Engineering, Nanjing University of Information Science & Technology, Nanjing 210044 2Paul Scherrer Institute, Villigen 5232, Switzerland
Abstract：As a continuous work of tracking electronic relaxation of the S2 state in o-xylene by photoelectron imaging [Y. Liu et al., Phys. Chem. Chem. Phys. 15 (2013) 18101], we report another contribution from the view of fragment-ion spectroscopy. Three components with time constants of τ1?60 fs, τ2=55(±20) fs and τ3=6.99(±0.25) ps are observed for the only fragment-ion C6H4CH3+. The velocity map image of the fragment-ion against the delay time are also measured. Transient information about the kinetic energy of the fragment-ion and angular distribution are analyzed and discussed. New features for competing ultrafast internal conversion and intersystem crossing are obtained.
2014, Vol. 31 
