中国物理快报  2014, Vol. 31 Issue (08): 88102-088102    DOI: 10.1088/0256-307X/31/8/088102
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Enhanced Depth of Lift-off Pattern Defined with Soft Mold Ultraviolet Nanoimprint by Multi-Layer Masks
WANG Zhi-Hao1**, LIU Wen1**, ZUO Qiang1, WANG Lei2, ZHAO Yan-Li1, XU Zhi-Mou1
1Wuhan National Laboratory for Optoelectronics, School of Optical and Electronic information, Huazhong University of Science and Technology, Wuhan 430074
2State Key Laboratory of Optical Communication Technologies and Networks, Wuhan Research Institute of Posts and Telecommunications, Wuhan 430074